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Journal: Electronics, 2020
Volume: 9
Number: 1119
Article:
Localization of Small Anomalies via the Orthogonality Sampling Method from Scattering Parameters
Authors:
by
Seongje Chae, Chi Young Ahn and Won-Kwang Park
Link:
https://www.mdpi.com/2079-9292/9/7/1119
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