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Open AccessArticle

Localization of Small Anomalies via the Orthogonality Sampling Method from Scattering Parameters

1
Department of Mathematics, Kookmin University, Seoul 02707, Korea
2
National Institute for Mathematical Sciences, Daejeon 34047, Korea
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Author to whom correspondence should be addressed.
Electronics 2020, 9(7), 1119; https://doi.org/10.3390/electronics9071119
Received: 18 June 2020 / Revised: 6 July 2020 / Accepted: 8 July 2020 / Published: 10 July 2020
(This article belongs to the Special Issue Photonic and Microwave Sensing Developments and Applications)
We investigate the application of the orthogonality sampling method (OSM) in microwave imaging for a fast localization of small anomalies from measured scattering parameters. For this purpose, we design an indicator function of OSM defined on a Lebesgue space to test the orthogonality relation between the Hankel function and the scattering parameters. This is based on an application of the Born approximation and the integral equation formula for scattering parameters in the presence of a small anomaly. We then prove that the indicator function consists of a combination of an infinite series of Bessel functions of integer order, an antenna configuration, and material properties. Simulation results with synthetic data are presented to show the feasibility and limitations of designed OSM. View Full-Text
Keywords: microwave imaging; orthogonality relation; orthogonality sampling method; scattering parameter; simulation results microwave imaging; orthogonality relation; orthogonality sampling method; scattering parameter; simulation results
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Chae, S.; Ahn, C.Y.; Park, W.-K. Localization of Small Anomalies via the Orthogonality Sampling Method from Scattering Parameters. Electronics 2020, 9, 1119.

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