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Journal: ElectronicsVolume: 9Number: 1691
Article: Intra-Network Interference Robustness: An Empirical Evaluation of IEEE 802.15.4-2015 SUN-OFDM
- Authors:
- Robbe Elsas1,*,
- Jeroen Hoebeke1 and
- Dries Van Leemput1
- et al.
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