Hindy, H.; Atkinson, R.; Tachtatzis, C.; Colin, J.-N.; Bayne, E.; Bellekens, X.
Utilising Deep Learning Techniques for Effective Zero-Day Attack Detection. Electronics 2020, 9, 1684.
https://doi.org/10.3390/electronics9101684
AMA Style
Hindy H, Atkinson R, Tachtatzis C, Colin J-N, Bayne E, Bellekens X.
Utilising Deep Learning Techniques for Effective Zero-Day Attack Detection. Electronics. 2020; 9(10):1684.
https://doi.org/10.3390/electronics9101684
Chicago/Turabian Style
Hindy, Hanan, Robert Atkinson, Christos Tachtatzis, Jean-Noël Colin, Ethan Bayne, and Xavier Bellekens.
2020. "Utilising Deep Learning Techniques for Effective Zero-Day Attack Detection" Electronics 9, no. 10: 1684.
https://doi.org/10.3390/electronics9101684
APA Style
Hindy, H., Atkinson, R., Tachtatzis, C., Colin, J.-N., Bayne, E., & Bellekens, X.
(2020). Utilising Deep Learning Techniques for Effective Zero-Day Attack Detection. Electronics, 9(10), 1684.
https://doi.org/10.3390/electronics9101684