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Journal: Electronics, 2020
Volume: 9
Number: 1619
Article:
A Methodology to Analyze the Fault Tolerance of Demosaicking Methods against Memory Single Event Functional Interrupts (SEFIs)
Authors:
by
Luis Alberto Aranda, Alfonso Sánchez-Macián and Juan Antonio Maestro
Link:
https://www.mdpi.com/2079-9292/9/10/1619
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