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Review of Polynomial Chaos-Based Methods for Uncertainty Quantification in Modern Integrated Circuits

IDLab, Department of Information Technology (INTEC), Ghent University—imec, Technologiepark—Zwijnaarde 15, 9052 Ghent, Belgium
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Electronics 2018, 7(3), 30; https://doi.org/10.3390/electronics7030030
Received: 16 February 2018 / Revised: 26 February 2018 / Accepted: 26 February 2018 / Published: 28 February 2018
Advances in manufacturing process technology are key ensembles for the production of integrated circuits in the sub-micrometer region. It is of paramount importance to assess the effects of tolerances in the manufacturing process on the performance of modern integrated circuits. The polynomial chaos expansion has emerged as a suitable alternative to standard Monte Carlo-based methods that are accurate, but computationally cumbersome. This paper provides an overview of the most recent developments and challenges in the application of polynomial chaos-based techniques for uncertainty quantification in integrated circuits, with particular focus on high-dimensional problems. View Full-Text
Keywords: polynomial chaos; uncertainty quantification; integrated circuits; high dimensionality polynomial chaos; uncertainty quantification; integrated circuits; high dimensionality
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Kaintura, A.; Dhaene, T.; Spina, D. Review of Polynomial Chaos-Based Methods for Uncertainty Quantification in Modern Integrated Circuits. Electronics 2018, 7, 30.

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