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Journal: ElectronicsVolume: 5Number: 14
Article: Gate Stability of GaN-Based HEMTs with P-Type Gate
  • Authors:
  • Matteo Meneghini1,*,
  • Isabella Rossetto1 and
  • Vanessa Rizzato1
  • et al.
Link: https://www.mdpi.com/2079-9292/5/2/14

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