Chiarella, F.; Barra, M.; Ricciotti, L.; Aloisio, A.; Cassinese, A.
Morphology, Electrical Performance and Potentiometry of PDIF-CN2 Thin-Film Transistors on HMDS-Treated and Bare Silicon Dioxide. Electronics 2014, 3, 76-86.
https://doi.org/10.3390/electronics3010076
AMA Style
Chiarella F, Barra M, Ricciotti L, Aloisio A, Cassinese A.
Morphology, Electrical Performance and Potentiometry of PDIF-CN2 Thin-Film Transistors on HMDS-Treated and Bare Silicon Dioxide. Electronics. 2014; 3(1):76-86.
https://doi.org/10.3390/electronics3010076
Chicago/Turabian Style
Chiarella, Fabio, Mario Barra, Laura Ricciotti, Alberto Aloisio, and Antonio Cassinese.
2014. "Morphology, Electrical Performance and Potentiometry of PDIF-CN2 Thin-Film Transistors on HMDS-Treated and Bare Silicon Dioxide" Electronics 3, no. 1: 76-86.
https://doi.org/10.3390/electronics3010076
APA Style
Chiarella, F., Barra, M., Ricciotti, L., Aloisio, A., & Cassinese, A.
(2014). Morphology, Electrical Performance and Potentiometry of PDIF-CN2 Thin-Film Transistors on HMDS-Treated and Bare Silicon Dioxide. Electronics, 3(1), 76-86.
https://doi.org/10.3390/electronics3010076