Ju, H.; Kong, D.-H.; Lee, K.; Lee, M.-K.; Cho, S.; Kim, S.-H.
How to Use Redundancy for Memory Reliability: Replace or Code? Electronics 2025, 14, 1812.
https://doi.org/10.3390/electronics14091812
AMA Style
Ju H, Kong D-H, Lee K, Lee M-K, Cho S, Kim S-H.
How to Use Redundancy for Memory Reliability: Replace or Code? Electronics. 2025; 14(9):1812.
https://doi.org/10.3390/electronics14091812
Chicago/Turabian Style
Ju, Hyosang, Dong-Hyun Kong, Kijun Lee, Myung-Kyu Lee, Sunghye Cho, and Sang-Hyo Kim.
2025. "How to Use Redundancy for Memory Reliability: Replace or Code?" Electronics 14, no. 9: 1812.
https://doi.org/10.3390/electronics14091812
APA Style
Ju, H., Kong, D.-H., Lee, K., Lee, M.-K., Cho, S., & Kim, S.-H.
(2025). How to Use Redundancy for Memory Reliability: Replace or Code? Electronics, 14(9), 1812.
https://doi.org/10.3390/electronics14091812