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Journal: Electronics, 2025
Volume: 14
Number: 1421
1421
Article: Single-Event Upset Characterization of a Shift Register in 16 nm FinFET Technology
Authors: by Federico D’Aniello, Marcello Tettamanti, Syed Adeel Ali Shah, Serena Mattiazzo, Stefano Bonaldo, Valeria Vadalà and Andrea Baschirotto
Link: https://www.mdpi.com/2079-9292/14/7/1421

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