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Journal: Electronics, 2025
Volume: 14
Number: 4486

Article: Lifetime Prediction of SiC MOSFET by LSTM Based on IGWO Algorithm
Authors: by Peng Dai, Junyi Bao, Zheng Gong, Mingchang Gao and Qing Xu
Link: https://www.mdpi.com/2079-9292/14/22/4486

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