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Journal: ElectronicsVolume: 14Number: 4251
Article: Replacing Batch Normalization with Memory-Based Affine Transformation for Test-Time Adaptation
  • Authors:
  • Jih Pin Yeh1,
  • Joe-Mei Feng2,* and
  • Hwei Jen Lin2,*
  • et al.
Link: https://www.mdpi.com/2079-9292/14/21/4251

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