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Journal: Electronics, 2025
Volume: 14
Number: 4251

Article: Replacing Batch Normalization with Memory-Based Affine Transformation for Test-Time Adaptation
Authors: by Jih Pin Yeh, Joe-Mei Feng, Hwei Jen Lin and Yoshimasa Tokuyama
Link: https://www.mdpi.com/2079-9292/14/21/4251

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