Zhao, D.; Shao, Y.; Zhang, S.; Li, T.; Chi, B.; Zhu, Y.; Liu, F.; Liang, Y.; Du, S.
Impact of Charge Carrier Trapping at the Ge/Si Interface on Charge Transport in Ge-on-Si Photodetectors. Electronics 2025, 14, 2982.
https://doi.org/10.3390/electronics14152982
AMA Style
Zhao D, Shao Y, Zhang S, Li T, Chi B, Zhu Y, Liu F, Liang Y, Du S.
Impact of Charge Carrier Trapping at the Ge/Si Interface on Charge Transport in Ge-on-Si Photodetectors. Electronics. 2025; 14(15):2982.
https://doi.org/10.3390/electronics14152982
Chicago/Turabian Style
Zhao, Dongyan, Yali Shao, Shuo Zhang, Tanyi Li, Boming Chi, Yaxing Zhu, Fang Liu, Yingzong Liang, and Sichao Du.
2025. "Impact of Charge Carrier Trapping at the Ge/Si Interface on Charge Transport in Ge-on-Si Photodetectors" Electronics 14, no. 15: 2982.
https://doi.org/10.3390/electronics14152982
APA Style
Zhao, D., Shao, Y., Zhang, S., Li, T., Chi, B., Zhu, Y., Liu, F., Liang, Y., & Du, S.
(2025). Impact of Charge Carrier Trapping at the Ge/Si Interface on Charge Transport in Ge-on-Si Photodetectors. Electronics, 14(15), 2982.
https://doi.org/10.3390/electronics14152982
