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Journal: Electronics, 2025
Volume: 14
Number: 163
Article:
Enhanced Short-Circuit Robustness of 1.2 kV Split Gate Silicon Carbide Metal Oxide Semiconductor Field-Effect Transistors for High-Frequency Applications
Authors:
by
Kanghee Shin, Dongkyun Kim, Minu Kim, Junho Park and Changho Han
Link:
https://www.mdpi.com/2079-9292/14/1/163
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