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Journal: Electronics, 2024
Volume: 13
Number: 21
Article:
Improved Test Input Prioritization Using Verification Monitors with False Prediction Cluster Centroids
Authors:
by
Hyekyoung Hwang, Il Yong Chun and Jitae Shin
Link:
https://www.mdpi.com/2079-9292/13/1/21
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