Order Article Reprints

Wu Z, Bai Y, Yang C, Li C, Hao J, Tian X, Wang A, Tang Y, Lu J, Liu X. Heavy Ion Induced Degradation Investigation on 4H-SiC JBS Diode with Different P+ Intervals. Electronics. 2023; 12(9):2133. https://doi.org/10.3390/electronics12092133

Wu, Zhikang, Yun Bai, Chengyue Yang, Chengzhan Li, Jilong Hao, Xiaoli Tian, Antao Wang, Yidan Tang, Jiang Lu, and Xinyu Liu. 2023. "Heavy Ion Induced Degradation Investigation on 4H-SiC JBS Diode with Different P+ Intervals" Electronics 12, no. 9: 2133. https://doi.org/10.3390/electronics12092133

Wu, Z., Bai, Y., Yang, C., Li, C., Hao, J., Tian, X., Wang, A., Tang, Y., Lu, J., & Liu, X. (2023). Heavy Ion Induced Degradation Investigation on 4H-SiC JBS Diode with Different P+ Intervals. Electronics, 12(9), 2133. https://doi.org/10.3390/electronics12092133