Order Article Reprints
Journal: Electronics, 2023
Volume: 12
Number: 2116
Article:
Insulated Gate Bipolar Transistor Reliability Study Based on Electro-Thermal Coupling Simulation
Authors:
by
Xiaoqing Yang, Xiaoyu Zhai, Shanshan Long, Meng Li, Hexin Dong and Yi He
Link:
https://www.mdpi.com/2079-9292/12/9/2116
MDPI offers high quality article reprints with convenient shipping to destinations worldwide. Each reprint features a 270 gsm bright white cover
and 105 gsm premium white paper, bound with two stitches for durability and printed in full color. The cover design is customized to your article
and designed to be complimentary to the journal.