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Journal: Electronics, 2023
Volume: 12
Number: 2116

Article: Insulated Gate Bipolar Transistor Reliability Study Based on Electro-Thermal Coupling Simulation
Authors: by Xiaoqing Yang, Xiaoyu Zhai, Shanshan Long, Meng Li, Hexin Dong and Yi He
Link: https://www.mdpi.com/2079-9292/12/9/2116

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