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Journal: ElectronicsVolume: 12Number: 2035
Article: LA_YOLOx: Effective Model to Detect the Surface Defects of Insulative Baffles
  • Authors:
  • Quanyang Li1,†,
  • Zhongqiang Luo2,*,† and
  • Xiangjie He2,†
  • et al.
Link: https://www.mdpi.com/2079-9292/12/9/2035

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