Karami, H.; Rubinstein, M.; Rachidi, F.; Perrenoud, C.; de Raemy, E.; Kraehenbuehl, P.; Mediano, A.
EMC Impact of Disturbances Generated by Multiple Sources. Electronics 2022, 11, 3530.
https://doi.org/10.3390/electronics11213530
AMA Style
Karami H, Rubinstein M, Rachidi F, Perrenoud C, de Raemy E, Kraehenbuehl P, Mediano A.
EMC Impact of Disturbances Generated by Multiple Sources. Electronics. 2022; 11(21):3530.
https://doi.org/10.3390/electronics11213530
Chicago/Turabian Style
Karami, Hamidreza, Marcos Rubinstein, Farhad Rachidi, Christophe Perrenoud, Emmanuel de Raemy, Pascal Kraehenbuehl, and Arturo Mediano.
2022. "EMC Impact of Disturbances Generated by Multiple Sources" Electronics 11, no. 21: 3530.
https://doi.org/10.3390/electronics11213530
APA Style
Karami, H., Rubinstein, M., Rachidi, F., Perrenoud, C., de Raemy, E., Kraehenbuehl, P., & Mediano, A.
(2022). EMC Impact of Disturbances Generated by Multiple Sources. Electronics, 11(21), 3530.
https://doi.org/10.3390/electronics11213530