EMC Impact of Disturbances Generated by Multiple Sources
Abstract
:1. Introduction
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- The proposed method uses the surface equivalent theory to calculate the electric and magnetic current densities (or fields) on a rectangular cuboid around each EMI source. This method allows any arbitrary number of different devices with different radiation patterns to be used to estimate the radiated emissions.
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- The locations and orientations of each EUT can be randomly selected. The proposed method does not have any restrictions on this point. After calculating the electric and magnetic current densities (or fields) for each source, these current densities (or fields) can be randomly positioned and/or rotated.
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2. Methods: Application of the Surface Equivalence Theorem
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- The full-wave solution of Maxwell’s equations for each EMI source is calculated only once in the determination of the equivalent sources. Alternatively, the near-field measurements to obtain the equivalent surface current densities of the real-world EMI source can be performed once.
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- Translation, rotation, assumed phase of the EMI sources, and changes in the observation point(s) do not affect the distribution of the equivalent surface current densities.
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- The equivalent surface current densities can be calculated or measured on an arbitrarily shaped surface, which can be determined based on the considered device (EMI source).
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- The total radiated emissions from multiple EMI sources can be easily calculated analytically by considering the equivalent surface current densities of each EMI source simultaneously.
2.1. Theory of Surface Equivalence for a Single EMI Source
2.2. Numerical Implementation of the Surface Equivalence Theorem and Validation for a Single Device
2.3. Calculation of Radiated Emission from Multiple EMI Sources Using the Surface Equivalence Theorem
3. Application of the Method to Calculate the Radiated Emissions from Multiple Devices
3.1. The Considered Configurations of EMI Sources
3.1.1. One-Dimensional Linear Array of EMI Sources
3.1.2. Two-Dimensional Rectangular Array of EMI Sources
3.1.3. Three-Dimensional Array of EMI Sources
3.2. Radiation from Multiple EMI Sources Configured in a One-Dimensional Linear Array
3.3. Radiation from Multiple EMI Sources Configured in a Two-Dimensional Linear Array
3.4. Radiation from Multiple EMI Sources Configured in a Three-Dimensional Linear Array
3.5. Radiation from Multiple Uncorrelated Devices with Arbitrary Locations and Orientations
4. Discussion and Conclusions
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- Radiation from multiple correlated devices;
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- Radiation from multiple uncorrelated devices;
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- Radiation from multiple uncorrelated devices with arbitrary locations and orientations.
Supplementary Materials
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
References
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Pattern | Placement and Orientation | Phase | Measurements | Theory | |
---|---|---|---|---|---|
Takahashi et al. [5] | isotropic | predefined | uncorrelated | included | power sum |
Häberlin [6] | isotropic | predefined | uncorrelated | not included | power sum |
Kootz and Kiwull [7] | dipole | predefined | uncorrelated | included | power sum |
Ghosh et al. [8] | slot | predefined | either correlated or uncorrelated | included | array formula |
Zhang et al. [9] | arbitrary | predefined | uncorrelated | included | SRT 1 |
This paper | arbitrary | random | arbitrary 2 | not included | SRT |
Radiated Emissions for Correlated Devices (V/m) | Mean and Std of the Radiated Emissions for Uncorrelated Devices (V/m) | Mean and Std of the Radiated Emissions for Uncorrelated Devices with Random Orientation (V/m) | |
---|---|---|---|
Single EUT | 2.28 | --- | --- |
3 devices | 2.19 | Mean: 3.35 | Mean: 2.26 |
Std: 1.52 | Std: 1.14 | ||
5 devices | 1.96 | Mean: 4.11 | Mean: 2.77 |
Std: 2.07 | Std: 1.43 | ||
7 devices | 4.26 | Mean: 4.56 | Mean: 3.02 |
Std: 2.26 | Std: 1.60 | ||
9 devices | 2.59 | Mean: 4.90 | Mean: 3.30 |
Std: 2.47 | Std: 1.73 |
Radiated Emissions for Correlated Devices (V/m) | Mean and Std of the Radiated Emissions for Uncorrelated Devices (V/m) | Mean and Std of the Radiated Emissions for Uncorrelated Devices with Random Orientation (V/m) | |
---|---|---|---|
Single EUT | 2.28 | --- | --- |
3 × 3 devices | 1.39 | Mean: 5.21 | Mean: 3.66 |
Std: 2.58 | Std: 1.88 | ||
5 × 5 devices | 4.39 | Mean: 7.41 | Mean: 5.43 |
Std: 3.76 | Std: 2.90 | ||
7 × 7 devices | 4.26 | Mean: 8.89 | Mean: 6.32 |
Std: 4.63 | Std: 3.44 | ||
9 × 9 devices | 12.13 | Mean: 9.55 | --- |
Std: 5.01 | --- |
Radiated Emissions for Correlated Devices (V/m) | Mean and Std of the Radiated Emissions for Uncorrelated Devices (V/m) | Mean and Std of the Radiated Emissions for Uncorrelated Devices with Random Orientation (V/m) | |
---|---|---|---|
Single EUT | 2.28 | --- | --- |
3 × 3 × 1 devices | 1.39 | Mean: 5.21 | Mean: 3.66 |
Std: 2.58 | Std: 1.88 | ||
3 × 3 × 2 devices | 3.98 | Mean: 6.84 | Mean: 4.65 |
Std: 3.58 | Std: 2.46 | ||
5 × 5 × 1 devices | 4.39 | Mean: 7.41 | Mean: 5.43 |
Std: 3.76 | Std: 2.90 | ||
5 × 5 × 2 devices | 9.34 | Mean: 9.62 | Mean: 6.72 |
Std: 5.03 | Std: 3.58 |
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Karami, H.; Rubinstein, M.; Rachidi, F.; Perrenoud, C.; de Raemy, E.; Kraehenbuehl, P.; Mediano, A. EMC Impact of Disturbances Generated by Multiple Sources. Electronics 2022, 11, 3530. https://doi.org/10.3390/electronics11213530
Karami H, Rubinstein M, Rachidi F, Perrenoud C, de Raemy E, Kraehenbuehl P, Mediano A. EMC Impact of Disturbances Generated by Multiple Sources. Electronics. 2022; 11(21):3530. https://doi.org/10.3390/electronics11213530
Chicago/Turabian StyleKarami, Hamidreza, Marcos Rubinstein, Farhad Rachidi, Christophe Perrenoud, Emmanuel de Raemy, Pascal Kraehenbuehl, and Arturo Mediano. 2022. "EMC Impact of Disturbances Generated by Multiple Sources" Electronics 11, no. 21: 3530. https://doi.org/10.3390/electronics11213530
APA StyleKarami, H., Rubinstein, M., Rachidi, F., Perrenoud, C., de Raemy, E., Kraehenbuehl, P., & Mediano, A. (2022). EMC Impact of Disturbances Generated by Multiple Sources. Electronics, 11(21), 3530. https://doi.org/10.3390/electronics11213530