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Journal: Electronics, 2022
Volume: 11
Number: 2242
Article:
Quantitative Research on Generalized Linear Modeling of SEU and Test Programs Based on Small Sample Data
Authors:
by
Fei Chu, Hongzhuan Chen, Chunqing Yu, Lihua You, Liang Wang and Yun Liu
Link:
https://www.mdpi.com/2079-9292/11/14/2242
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