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Electronics
Volume 10
Issue 19
10.3390/electronics10192427
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Journal: Electronics, 2021
Volume: 10
Number: 2427

Article: Assessment and Improvement of the Pattern Recognition Performance of Memdiode-Based Cross-Point Arrays with Randomly Distributed Stuck-at-Faults
Authors: by Fernando L. Aguirre, Sebastián M. Pazos, Félix Palumbo, Antoni Morell, Jordi Suñé and Enrique Miranda
Link: https://www.mdpi.com/2079-9292/10/19/2427

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