Runolinna, M.; Turnquist, M.; Teittinen, J.; Ilmonen, P.; Koskinen, L.
Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions. J. Low Power Electron. Appl. 2023, 13, 22.
https://doi.org/10.3390/jlpea13010022
AMA Style
Runolinna M, Turnquist M, Teittinen J, Ilmonen P, Koskinen L.
Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions. Journal of Low Power Electronics and Applications. 2023; 13(1):22.
https://doi.org/10.3390/jlpea13010022
Chicago/Turabian Style
Runolinna, Miikka, Matthew Turnquist, Jukka Teittinen, Pauliina Ilmonen, and Lauri Koskinen.
2023. "Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions" Journal of Low Power Electronics and Applications 13, no. 1: 22.
https://doi.org/10.3390/jlpea13010022
APA Style
Runolinna, M., Turnquist, M., Teittinen, J., Ilmonen, P., & Koskinen, L.
(2023). Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions. Journal of Low Power Electronics and Applications, 13(1), 22.
https://doi.org/10.3390/jlpea13010022