Cheng, H.-Y.; Chen, Y.-C.; Li, C.-L.; Li, P.-J.; Houng, M.-P.; Yang, C.-F.
Developments of the Physical and Electrical Properties of NiCr and NiCrSi Single-Layer and Bi-Layer Nano-Scale Thin-Film Resistors. Nanomaterials 2016, 6, 39.
https://doi.org/10.3390/nano6030039
AMA Style
Cheng H-Y, Chen Y-C, Li C-L, Li P-J, Houng M-P, Yang C-F.
Developments of the Physical and Electrical Properties of NiCr and NiCrSi Single-Layer and Bi-Layer Nano-Scale Thin-Film Resistors. Nanomaterials. 2016; 6(3):39.
https://doi.org/10.3390/nano6030039
Chicago/Turabian Style
Cheng, Huan-Yi, Ying-Chung Chen, Chi-Lun Li, Pei-Jou Li, Mau-Phon Houng, and Cheng-Fu Yang.
2016. "Developments of the Physical and Electrical Properties of NiCr and NiCrSi Single-Layer and Bi-Layer Nano-Scale Thin-Film Resistors" Nanomaterials 6, no. 3: 39.
https://doi.org/10.3390/nano6030039
APA Style
Cheng, H.-Y., Chen, Y.-C., Li, C.-L., Li, P.-J., Houng, M.-P., & Yang, C.-F.
(2016). Developments of the Physical and Electrical Properties of NiCr and NiCrSi Single-Layer and Bi-Layer Nano-Scale Thin-Film Resistors. Nanomaterials, 6(3), 39.
https://doi.org/10.3390/nano6030039