Order Article Reprints

Feng J, Jeon S-H, Park J, Lee S-H, Jang J, Kang IM, Kim D-K, Bae J-H. Improvement in Switching Characteristics and Bias Stability of Solution-Processed Zinc–Tin Oxide Thin Film Transistors via Simple Low-Pressure Thermal Annealing Treatment. Nanomaterials. 2023; 13(11):1722. https://doi.org/10.3390/nano13111722

Feng, Junhao, Sang-Hwa Jeon, Jaehoon Park, Sin-Hyung Lee, Jaewon Jang, In Man Kang, Do-Kyung Kim, and Jin-Hyuk Bae. 2023. "Improvement in Switching Characteristics and Bias Stability of Solution-Processed Zinc–Tin Oxide Thin Film Transistors via Simple Low-Pressure Thermal Annealing Treatment" Nanomaterials 13, no. 11: 1722. https://doi.org/10.3390/nano13111722

Feng, J., Jeon, S.-H., Park, J., Lee, S.-H., Jang, J., Kang, I. M., Kim, D.-K., & Bae, J.-H. (2023). Improvement in Switching Characteristics and Bias Stability of Solution-Processed Zinc–Tin Oxide Thin Film Transistors via Simple Low-Pressure Thermal Annealing Treatment. Nanomaterials, 13(11), 1722. https://doi.org/10.3390/nano13111722