Quan, X.; Ma, G.; Wan, F.; Huang, X.; Mou, X.; Meng, X.; Liu, Z.; Ji, X.; Zhu, Z.
Non-Destructive Quality Prediction of Fresh Goji Berries During Storage Using Dielectric Properties and ANN Modeling. Agriculture 2025, 15, 2353.
https://doi.org/10.3390/agriculture15222353
AMA Style
Quan X, Ma G, Wan F, Huang X, Mou X, Meng X, Liu Z, Ji X, Zhu Z.
Non-Destructive Quality Prediction of Fresh Goji Berries During Storage Using Dielectric Properties and ANN Modeling. Agriculture. 2025; 15(22):2353.
https://doi.org/10.3390/agriculture15222353
Chicago/Turabian Style
Quan, Xin, Guojun Ma, Fangxin Wan, Xiaopeng Huang, Xiaobin Mou, Xin Meng, Zelin Liu, Xiaokang Ji, and Zewen Zhu.
2025. "Non-Destructive Quality Prediction of Fresh Goji Berries During Storage Using Dielectric Properties and ANN Modeling" Agriculture 15, no. 22: 2353.
https://doi.org/10.3390/agriculture15222353
APA Style
Quan, X., Ma, G., Wan, F., Huang, X., Mou, X., Meng, X., Liu, Z., Ji, X., & Zhu, Z.
(2025). Non-Destructive Quality Prediction of Fresh Goji Berries During Storage Using Dielectric Properties and ANN Modeling. Agriculture, 15(22), 2353.
https://doi.org/10.3390/agriculture15222353
