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Journal: Appl. Sci., 2025
Volume: 15
Number: 4825

Article: Defect R-CNN: A Novel High-Precision Method for CT Image Defect Detection
Authors: by Zirou Jiang, Jintao Fu, Tianchen Zeng, Renjie Liu, Peng Cong, Jichen Miao and Yuewen Sun
Link: https://www.mdpi.com/2076-3417/15/9/4825

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