Zhan, W.; Zhou, Y.; Zheng, J.; Cai, X.; Zhang, Q.; Wen, X.
A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing. Appl. Sci. 2025, 15, 2009.
https://doi.org/10.3390/app15042009
AMA Style
Zhan W, Zhou Y, Zheng J, Cai X, Zhang Q, Wen X.
A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing. Applied Sciences. 2025; 15(4):2009.
https://doi.org/10.3390/app15042009
Chicago/Turabian Style
Zhan, Wenfa, Yangxinzi Zhou, Jiangyun Zheng, Xueyuan Cai, Qingping Zhang, and Xiaoqing Wen.
2025. "A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing" Applied Sciences 15, no. 4: 2009.
https://doi.org/10.3390/app15042009
APA Style
Zhan, W., Zhou, Y., Zheng, J., Cai, X., Zhang, Q., & Wen, X.
(2025). A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing. Applied Sciences, 15(4), 2009.
https://doi.org/10.3390/app15042009