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Journal: Applied SciencesVolume: 15Number: 9457
Article: Surface Roughness, Residual Stress, and Optical and Structural Properties of Evaporated VO2 Thin Films Prepared with Different Tungsten Doping Amounts
- Authors:
- Chuen-Lin Tien1,*,
- Chun-Yu Chiang2 and
- Yi-Lin Wang1
- et al.
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