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Journal: Appl. Sci., 2025
Volume: 15
Number: 9457
Article:
Surface Roughness, Residual Stress, and Optical and Structural Properties of Evaporated VO2 Thin Films Prepared with Different Tungsten Doping Amounts
Authors:
by
Chuen-Lin Tien, Chun-Yu Chiang, Yi-Lin Wang, Ching-Chiun Wang and Shih-Chin Lin
Link:
https://www.mdpi.com/2076-3417/15/17/9457
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