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Journal: Applied SciencesVolume: 14Number: 8767
Article: Multi-Stress Accelerated Degradation Testing Reliability Assessment of LED Lamp Beads Considering Generalized Coupling
  • Authors:
  • Yinglong Dong1,
  • Zhen Zhou1,* and
  • Kaixin Liu2
  • et al.
Link: https://www.mdpi.com/2076-3417/14/19/8767

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