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Journal: Appl. Sci., 2024
Volume: 14
Number: 8767
Article:
Multi-Stress Accelerated Degradation Testing Reliability Assessment of LED Lamp Beads Considering Generalized Coupling
Authors:
by
Yinglong Dong, Zhen Zhou, Kaixin Liu and Xu Yang
Link:
https://www.mdpi.com/2076-3417/14/19/8767
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