Stoschka, M.; Horvath, M.; Fladischer, S.; Oberreiter, M.
Study of Local Fatigue Methods (TCD, N-SIF, and ESED) on Notches and Defects Related to Numerical Efficiency. Appl. Sci. 2023, 13, 2247.
https://doi.org/10.3390/app13042247
AMA Style
Stoschka M, Horvath M, Fladischer S, Oberreiter M.
Study of Local Fatigue Methods (TCD, N-SIF, and ESED) on Notches and Defects Related to Numerical Efficiency. Applied Sciences. 2023; 13(4):2247.
https://doi.org/10.3390/app13042247
Chicago/Turabian Style
Stoschka, Michael, Michael Horvath, Stefan Fladischer, and Matthias Oberreiter.
2023. "Study of Local Fatigue Methods (TCD, N-SIF, and ESED) on Notches and Defects Related to Numerical Efficiency" Applied Sciences 13, no. 4: 2247.
https://doi.org/10.3390/app13042247
APA Style
Stoschka, M., Horvath, M., Fladischer, S., & Oberreiter, M.
(2023). Study of Local Fatigue Methods (TCD, N-SIF, and ESED) on Notches and Defects Related to Numerical Efficiency. Applied Sciences, 13(4), 2247.
https://doi.org/10.3390/app13042247