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Journal: SymmetryVolume: 14Number: 399
Article: Characterization of Microstructure of Crept Nb and Ta-Rich γ-TiAl Alloys by Automated Crystal Orientation Mapping and Electron Back Scatter Diffraction
  • Authors:
  • Vajinder Singh1,
  • Chandan Mondal2 and
  • Rajdeep Sarkar1
  • et al.
Link: https://www.mdpi.com/2073-8994/14/2/399

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