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Journal: Crystals, 2017
Volume: 7
Number: 347
347
Article: Quantitative Imaging of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon
Authors: by Brian K. Tanner, David Allen, Jochen Wittge, Andreas N. Danilewsky, Jorge Garagorri, Eider Gorostegui-Colinas, M. Reyes Elizalde and Patrick J. McNally
Link: https://www.mdpi.com/2073-4352/7/11/347

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