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Open AccessArticle

Raman Identification of Polymorphs in Pentacene Films

Dipartimento di Chimica & INSTM UdR Parma, Università di Parma, Parco Area delle Scienze 17/a, I-43124 Parma, Italy
Dipartimento di Chimica Indutriale “Toso Montanari” & INSTM UdR Bologna, Università di Bologna, viale Risorgimento 4, I-40136 Bologna, Italy
IMEM-CNR Trento, Istituto Materiali per Elettronica e Magnetismo-Consiglio Nazionale Ricerche, Via Alla Cascata 56/C, I-38123 Trento, Italy
IMEM-CNR Parma, Istituto Materiali per Elettronica e Magnetismo-Consiglio Nazionale Ricerche, Parco dArea delle Scienze, I-43124 Parma, Italy
Author to whom correspondence should be addressed.
These authors contributed equally to this work.
Academic Editor: Helmut Cölfen
Crystals 2016, 6(4), 41;
Received: 21 January 2016 / Revised: 10 March 2016 / Accepted: 5 April 2016 / Published: 8 April 2016
(This article belongs to the Section Biomolecular Crystals)
We use Raman spectroscopy to characterize thin films of pentacene grown on Si/SiO x by Supersonic Molecular Beam Deposition (SuMBD). We find that films up to a thickness of about 781 Å (∼ 52 monolayers) all belong to the so-called thin-film (TF) phase. The appearance with strong intensity of some lattice phonons suggests that the films are characterized by good intra-layer order. A comparison of the Raman spectra in the lattice and CH bending spectral regions of the TF polymorph with the corresponding ones of the high-temperature (HT) and low-temperature (LT) bulk pentacene polymorphs provides a quick and nondestructive method to identify the different phases. View Full-Text
Keywords: pentacene; polymorphism; raman spectroscopy pentacene; polymorphism; raman spectroscopy
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MDPI and ACS Style

Girlando, A.; Masino, M.; Brillante, A.; Toccoli, T.; Iannotta, S. Raman Identification of Polymorphs in Pentacene Films. Crystals 2016, 6, 41.

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