Article Versions Notes

Sun X, Cai Q, Qi J, Liu B, Zheng Y, Zhang R, Li J, Wang S, Chen L, Lee Y. Temperature-Dependent Spectroscopic Ellipsometry and Modeling of the Optical Properties of Vanadium Dioxide Thin Films. Crystals. 2025; 15(4):325. https://doi.org/10.3390/cryst15040325

Sun, Xiaojie, Qingyuan Cai, Jiao Qi, Baojian Liu, Yuxiang Zheng, Rongjun Zhang, Jing Li, Songyou Wang, Liangyao Chen, and Youngpak Lee. 2025. "Temperature-Dependent Spectroscopic Ellipsometry and Modeling of the Optical Properties of Vanadium Dioxide Thin Films" Crystals 15, no. 4: 325. https://doi.org/10.3390/cryst15040325

Sun, X., Cai, Q., Qi, J., Liu, B., Zheng, Y., Zhang, R., Li, J., Wang, S., Chen, L., & Lee, Y. (2025). Temperature-Dependent Spectroscopic Ellipsometry and Modeling of the Optical Properties of Vanadium Dioxide Thin Films. Crystals, 15(4), 325. https://doi.org/10.3390/cryst15040325