Zhang, M.; Wang, L.; Yang, K.; Yao, J.; Tang, W.; Guo, Y.
Breakdown Characteristics of Ga2O3-on-SiC Metal-Oxide-Semiconductor Field-Effect Transistors. Crystals 2023, 13, 917.
https://doi.org/10.3390/cryst13060917
AMA Style
Zhang M, Wang L, Yang K, Yao J, Tang W, Guo Y.
Breakdown Characteristics of Ga2O3-on-SiC Metal-Oxide-Semiconductor Field-Effect Transistors. Crystals. 2023; 13(6):917.
https://doi.org/10.3390/cryst13060917
Chicago/Turabian Style
Zhang, Maolin, Lei Wang, Kemeng Yang, Jiafei Yao, Weihua Tang, and Yufeng Guo.
2023. "Breakdown Characteristics of Ga2O3-on-SiC Metal-Oxide-Semiconductor Field-Effect Transistors" Crystals 13, no. 6: 917.
https://doi.org/10.3390/cryst13060917
APA Style
Zhang, M., Wang, L., Yang, K., Yao, J., Tang, W., & Guo, Y.
(2023). Breakdown Characteristics of Ga2O3-on-SiC Metal-Oxide-Semiconductor Field-Effect Transistors. Crystals, 13(6), 917.
https://doi.org/10.3390/cryst13060917