Chen, M.;                     Li, J.;                     Su, W.;                     Nie, Z.;                     Zhong, B.;                     Dong, X.    
        Residual Stress Testing and Simulation Analysis of Crystal Structures of Electronic Device Materials. Crystals 2023, 13, 1462.
    https://doi.org/10.3390/cryst13101462
    AMA Style
    
                                Chen M,                                 Li J,                                 Su W,                                 Nie Z,                                 Zhong B,                                 Dong X.        
                Residual Stress Testing and Simulation Analysis of Crystal Structures of Electronic Device Materials. Crystals. 2023; 13(10):1462.
        https://doi.org/10.3390/cryst13101462
    
    Chicago/Turabian Style
    
                                Chen, Ming,                                 Jiasheng Li,                                 Wei Su,                                 Zhenhua Nie,                                 Butian Zhong,                                 and Xianshan Dong.        
                2023. "Residual Stress Testing and Simulation Analysis of Crystal Structures of Electronic Device Materials" Crystals 13, no. 10: 1462.
        https://doi.org/10.3390/cryst13101462
    
    APA Style
    
                                Chen, M.,                                 Li, J.,                                 Su, W.,                                 Nie, Z.,                                 Zhong, B.,                                 & Dong, X.        
        
        (2023). Residual Stress Testing and Simulation Analysis of Crystal Structures of Electronic Device Materials. Crystals, 13(10), 1462.
        https://doi.org/10.3390/cryst13101462