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Journal: MicromachinesVolume: 15Number: 80
Article: Review on Main Gate Characteristics of P-Type GaN Gate High-Electron-Mobility Transistors
  • Authors:
  • Zhongxu Wang1,
  • Jiao Nan1 and
  • Zhiwen Tian2
  • et al.
Link: https://www.mdpi.com/2072-666X/15/1/80

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