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Journal: Micromachines, 2025
Volume: 16
Number: 434
Article:
Overview of the Properties and Formation Process of Interface Traps in MOS and Linear Bipolar Devices
Authors:
by
Yanru Ren, Min Zhu, Xuehui Dai, Longxian Li and Minghui Liu
Link:
https://www.mdpi.com/2072-666X/16/4/434
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