Shin, M.-G.; Bae, K.-H.; Jeong, H.-S.; Kim, D.-H.; Cha, H.-S.; Kwon, H.-I.
Effects of Capping Layers with Different Metals on Electrical Performance and Stability of p-Channel SnO Thin-Film Transistors. Micromachines 2020, 11, 917.
https://doi.org/10.3390/mi11100917
AMA Style
Shin M-G, Bae K-H, Jeong H-S, Kim D-H, Cha H-S, Kwon H-I.
Effects of Capping Layers with Different Metals on Electrical Performance and Stability of p-Channel SnO Thin-Film Transistors. Micromachines. 2020; 11(10):917.
https://doi.org/10.3390/mi11100917
Chicago/Turabian Style
Shin, Min-Gyu, Kang-Hwan Bae, Hwan-Seok Jeong, Dae-Hwan Kim, Hyun-Seok Cha, and Hyuck-In Kwon.
2020. "Effects of Capping Layers with Different Metals on Electrical Performance and Stability of p-Channel SnO Thin-Film Transistors" Micromachines 11, no. 10: 917.
https://doi.org/10.3390/mi11100917
APA Style
Shin, M.-G., Bae, K.-H., Jeong, H.-S., Kim, D.-H., Cha, H.-S., & Kwon, H.-I.
(2020). Effects of Capping Layers with Different Metals on Electrical Performance and Stability of p-Channel SnO Thin-Film Transistors. Micromachines, 11(10), 917.
https://doi.org/10.3390/mi11100917