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Journal: Micromachines, 2020
Volume: 11
Number: 53

Article: Thermal Analysis and Operational Characteristics of an AlGaN/GaN High Electron Mobility Transistor with Copper-Filled Structures: A Simulation Study
Authors: by Kyu-Won Jang, In-Tae Hwang, Hyun-Jung Kim, Sang-Heung Lee, Jong-Won Lim and Hyun-Seok Kim
Link: https://www.mdpi.com/2072-666X/11/1/53

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