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Materials 2016, 9(8), 631;

Negative Thermal Expansion in Ba0.5Sr0.5Zn2SiGeO7

Otto-Schott-Institut für Materialforschung, Jena University, Fraunhoferstr. 6, Jena 07743, Germany
Author to whom correspondence should be addressed.
Academic Editor: Tamas Varga
Received: 30 June 2016 / Revised: 16 July 2016 / Accepted: 21 July 2016 / Published: 27 July 2016
(This article belongs to the Special Issue Negative Thermal Expansion Materials)
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Solid solutions with the composition Ba0.5Sr0.5Zn2Si2-xGexO7 and BaZn2Si2-xGexO7 were prepared with different values of x using a conventional mixed oxide route. Both compounds exhibit very different thermal expansion, which is due to the different crystal structures. Ba0.5Sr0.5Zn2Si2-xGexO7 solid solutions exhibit the structure of high-temperature BaZn2Si2O7 and show negative thermal expansion, which was proven via high-temperature X-ray diffraction. Up to around x = 1, the crystal structure remains the same. Above this value, the low-temperature phase becomes stable. The Sr-free solid solutions have the crystal structure of low-temperature BaZn2Si2O7 and show also a limited solubility of Ge. These Sr-free compositions show transitions of low- to high-temperature phases, which are shifted to higher temperatures with increasing Ge-concentration. View Full-Text
Keywords: X-ray diffraction; negative thermal expansion; phase transition X-ray diffraction; negative thermal expansion; phase transition

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Thieme, C.; Rüssel, C. Negative Thermal Expansion in Ba0.5Sr0.5Zn2SiGeO7. Materials 2016, 9, 631.

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