Article Versions Notes

Zhang C, Gao S, Zhu M, Shao Z, Nie L, Wang H, Jia Y, Fu B. Microwave Dielectric Properties and Defect Behavior of xTiO₂-(1-x)SiO₂ Glass. Materials. 2025; 18(2):320. https://doi.org/10.3390/ma18020320

Zhang, Chenyang, Sijian Gao, Mankang Zhu, Zhufeng Shao, Lanjian Nie, Hui Wang, Yanan Jia, and Bo Fu. 2025. "Microwave Dielectric Properties and Defect Behavior of xTiO₂-(1-x)SiO₂ Glass" Materials 18, no. 2: 320. https://doi.org/10.3390/ma18020320

Zhang, C., Gao, S., Zhu, M., Shao, Z., Nie, L., Wang, H., Jia, Y., & Fu, B. (2025). Microwave Dielectric Properties and Defect Behavior of xTiO₂-(1-x)SiO₂ Glass. Materials, 18(2), 320. https://doi.org/10.3390/ma18020320