Berkmans, F.; Lemesle, J.; Guibert, R.; Wieczorowski, M.; Brown, C.; Bigerelle, M.
Two 3D Fractal-Based Approaches for Topographical Characterization: Richardson Patchwork versus Sdr. Materials 2024, 17, 2386.
https://doi.org/10.3390/ma17102386
AMA Style
Berkmans F, Lemesle J, Guibert R, Wieczorowski M, Brown C, Bigerelle M.
Two 3D Fractal-Based Approaches for Topographical Characterization: Richardson Patchwork versus Sdr. Materials. 2024; 17(10):2386.
https://doi.org/10.3390/ma17102386
Chicago/Turabian Style
Berkmans, François, Julie Lemesle, Robin Guibert, Michał Wieczorowski, Christopher Brown, and Maxence Bigerelle.
2024. "Two 3D Fractal-Based Approaches for Topographical Characterization: Richardson Patchwork versus Sdr" Materials 17, no. 10: 2386.
https://doi.org/10.3390/ma17102386
APA Style
Berkmans, F., Lemesle, J., Guibert, R., Wieczorowski, M., Brown, C., & Bigerelle, M.
(2024). Two 3D Fractal-Based Approaches for Topographical Characterization: Richardson Patchwork versus Sdr. Materials, 17(10), 2386.
https://doi.org/10.3390/ma17102386