Naber, C.; Kleiner, F.; Becker, F.; Nguyen-Tuan, L.; Rößler, C.; Etzold, M.A.; Neubauer, J.
C-S-H Pore Size Characterization Via a Combined Nuclear Magnetic Resonance (NMR)–Scanning Electron Microscopy (SEM) Surface Relaxivity Calibration. Materials 2020, 13, 1779.
https://doi.org/10.3390/ma13071779
AMA Style
Naber C, Kleiner F, Becker F, Nguyen-Tuan L, Rößler C, Etzold MA, Neubauer J.
C-S-H Pore Size Characterization Via a Combined Nuclear Magnetic Resonance (NMR)–Scanning Electron Microscopy (SEM) Surface Relaxivity Calibration. Materials. 2020; 13(7):1779.
https://doi.org/10.3390/ma13071779
Chicago/Turabian Style
Naber, Christoph, Florian Kleiner, Franz Becker, Long Nguyen-Tuan, Christiane Rößler, Merlin A. Etzold, and Jürgen Neubauer.
2020. "C-S-H Pore Size Characterization Via a Combined Nuclear Magnetic Resonance (NMR)–Scanning Electron Microscopy (SEM) Surface Relaxivity Calibration" Materials 13, no. 7: 1779.
https://doi.org/10.3390/ma13071779
APA Style
Naber, C., Kleiner, F., Becker, F., Nguyen-Tuan, L., Rößler, C., Etzold, M. A., & Neubauer, J.
(2020). C-S-H Pore Size Characterization Via a Combined Nuclear Magnetic Resonance (NMR)–Scanning Electron Microscopy (SEM) Surface Relaxivity Calibration. Materials, 13(7), 1779.
https://doi.org/10.3390/ma13071779
