Oliveira, J.; Reynes, J.-M.; Morel, H.; Frey, P.; Perrotin, O.; Allirand, L.; Azzopardi, S.; Piton, M.; Coccetti, F.
Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs. Energies 2024, 17, 5476.
https://doi.org/10.3390/en17215476
AMA Style
Oliveira J, Reynes J-M, Morel H, Frey P, Perrotin O, Allirand L, Azzopardi S, Piton M, Coccetti F.
Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs. Energies. 2024; 17(21):5476.
https://doi.org/10.3390/en17215476
Chicago/Turabian Style
Oliveira, Joao, Jean-Michel Reynes, Hervé Morel, Pascal Frey, Olivier Perrotin, Laurence Allirand, Stéphane Azzopardi, Michel Piton, and Fabio Coccetti.
2024. "Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs" Energies 17, no. 21: 5476.
https://doi.org/10.3390/en17215476
APA Style
Oliveira, J., Reynes, J.-M., Morel, H., Frey, P., Perrotin, O., Allirand, L., Azzopardi, S., Piton, M., & Coccetti, F.
(2024). Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs. Energies, 17(21), 5476.
https://doi.org/10.3390/en17215476
