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Journal: Energies, 2024
Volume: 17
Number: 2616
Article:
Optimizing Insulated-Gate Bipolar Transistors’ Lifetime Estimation: A Critical Evaluation of Lifetime Model Adjustments Based on Power Cycling Tests
Authors:
by
Omid Alavi, Ward De Ceuninck and Michaël Daenen
Link:
https://www.mdpi.com/1996-1073/17/11/2616
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