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Journal: EnergiesVolume: 17Number: 2616
Article: Optimizing Insulated-Gate Bipolar Transistors’ Lifetime Estimation: A Critical Evaluation of Lifetime Model Adjustments Based on Power Cycling Tests
- Authors:
- Omid Alavi1,2,3,*,
- Ward De Ceuninck1,2,3 and
- Michaël Daenen1,2,3
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