Peng, X.; Li, J.; Zhang, D.; Hu, C.; Sun, N.; Jiang, J.
High-Precision ADC Spectrum Testing under Non-Coherent Sampling Conditions. Sensors 2022, 22, 8170.
https://doi.org/10.3390/s22218170
AMA Style
Peng X, Li J, Zhang D, Hu C, Sun N, Jiang J.
High-Precision ADC Spectrum Testing under Non-Coherent Sampling Conditions. Sensors. 2022; 22(21):8170.
https://doi.org/10.3390/s22218170
Chicago/Turabian Style
Peng, Xiaofei, Jie Li, Debiao Zhang, Chenjun Hu, Ning Sun, and Jie Jiang.
2022. "High-Precision ADC Spectrum Testing under Non-Coherent Sampling Conditions" Sensors 22, no. 21: 8170.
https://doi.org/10.3390/s22218170
APA Style
Peng, X., Li, J., Zhang, D., Hu, C., Sun, N., & Jiang, J.
(2022). High-Precision ADC Spectrum Testing under Non-Coherent Sampling Conditions. Sensors, 22(21), 8170.
https://doi.org/10.3390/s22218170