Peng, X.;                     Li, J.;                     Zhang, D.;                     Hu, C.;                     Sun, N.;                     Jiang, J.    
        High-Precision ADC Spectrum Testing under Non-Coherent Sampling Conditions. Sensors 2022, 22, 8170.
    https://doi.org/10.3390/s22218170
    AMA Style
    
                                Peng X,                                 Li J,                                 Zhang D,                                 Hu C,                                 Sun N,                                 Jiang J.        
                High-Precision ADC Spectrum Testing under Non-Coherent Sampling Conditions. Sensors. 2022; 22(21):8170.
        https://doi.org/10.3390/s22218170
    
    Chicago/Turabian Style
    
                                Peng, Xiaofei,                                 Jie Li,                                 Debiao Zhang,                                 Chenjun Hu,                                 Ning Sun,                                 and Jie Jiang.        
                2022. "High-Precision ADC Spectrum Testing under Non-Coherent Sampling Conditions" Sensors 22, no. 21: 8170.
        https://doi.org/10.3390/s22218170
    
    APA Style
    
                                Peng, X.,                                 Li, J.,                                 Zhang, D.,                                 Hu, C.,                                 Sun, N.,                                 & Jiang, J.        
        
        (2022). High-Precision ADC Spectrum Testing under Non-Coherent Sampling Conditions. Sensors, 22(21), 8170.
        https://doi.org/10.3390/s22218170