Jäger, M.; Bruns, J.; Schneidewind, J.; Pinnow, C.; Gargouri, H.; Petermann, K.
An Integrated Evanescent Field Sensor for the Simultaneous Measurement of Layer Refractive Index and Thickness. Sensors 2021, 21, 1628.
https://doi.org/10.3390/s21051628
AMA Style
Jäger M, Bruns J, Schneidewind J, Pinnow C, Gargouri H, Petermann K.
An Integrated Evanescent Field Sensor for the Simultaneous Measurement of Layer Refractive Index and Thickness. Sensors. 2021; 21(5):1628.
https://doi.org/10.3390/s21051628
Chicago/Turabian Style
Jäger, Matthias, Jürgen Bruns, Jessica Schneidewind, Cay Pinnow, Hassan Gargouri, and Klaus Petermann.
2021. "An Integrated Evanescent Field Sensor for the Simultaneous Measurement of Layer Refractive Index and Thickness" Sensors 21, no. 5: 1628.
https://doi.org/10.3390/s21051628
APA Style
Jäger, M., Bruns, J., Schneidewind, J., Pinnow, C., Gargouri, H., & Petermann, K.
(2021). An Integrated Evanescent Field Sensor for the Simultaneous Measurement of Layer Refractive Index and Thickness. Sensors, 21(5), 1628.
https://doi.org/10.3390/s21051628