Article Versions Notes

Principato F, Allegra G, Cappello C, Crepel O, Nicosia N, D′Arrigo S, Cantarella V, Di Mauro A, Abbene L, Mirabello M, et al. Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs Lifetime by Reliability Tests. Sensors. 2021; 21(16):5627. https://doi.org/10.3390/s21165627

Principato, Fabio, Giuseppe Allegra, Corrado Cappello, Olivier Crepel, Nicola Nicosia, Salvatore D′Arrigo, Vincenzo Cantarella, Alessandro Di Mauro, Leonardo Abbene, Marcello Mirabello, and et al. 2021. "Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs Lifetime by Reliability Tests" Sensors 21, no. 16: 5627. https://doi.org/10.3390/s21165627

Principato, F., Allegra, G., Cappello, C., Crepel, O., Nicosia, N., D′Arrigo, S., Cantarella, V., Di Mauro, A., Abbene, L., Mirabello, M., & Pintacuda, F. (2021). Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs Lifetime by Reliability Tests. Sensors, 21(16), 5627. https://doi.org/10.3390/s21165627